Graph | Data structure | Type of test | p |
---|---|---|---|
Fig. 2B, bin 1 | Nonparametric | Steel–Dwass | Cont vs Puncture only, p = 0.9990; Cont vs pDNA injection, p = 0.0011; Cont vs Electrical shock only, p = 0.9973; Cont vs TE buffer injection, p = 0.9871 |
Fig. 2B, bin 2 | Nonparametric | Steel–Dwass | Cont vs Puncture only, p = 0.9781; Cont vs pDNA injection, p = 0.0369; Cont vs Electrical shock only, p = 0.9937; Cont vs TE buffer injection, p = 0.9996 |
Fig. 2B, bin 3 | Nonparametric | Steel–Dwass | Cont vs Puncture only, p = 1.0000; Cont vs pDNA injection, p = 0.0055; Cont vs Electrical shock only, p = 0.9976; Cont vs TE buffer injection, p = 0.9976 |
Fig. 2B, bin 4 | Nonparametric | Steel–Dwass | Cont vs Puncture only, p = 0.9992; Cont vs pDNA injection, p = 0.0154; Cont vs Electrical shock only, p = 0.9964; Cont vs TE buffer injection, p = 0.9996 |
Fig. 2B, bin 5 | Nonparametric | Steel–Dwass | Cont vs Puncture only, p = 0.9473; Cont vs pDNA injection, p = 0.1056; Cont vs Electrical shock only, p = 0.9976; Cont vs TE buffer injection, p = 1.0000 |
Fig. 2B, bin 6 | Nonparametric | Steel–Dwass | Cont vs Puncture only, p = 0.9998; Cont vs pDNA injection, p = 0.3261; Cont vs Electrical shock only, p = 0.9962; Cont vs TE buffer injection, p = 1.0000 |
Fig. 2C | Nonparametric | Steel–Dwass | Cont vs Puncture only, p = 0.9994; Cont vs pDNA injection, p = 1.0000; Cont vs Electrical shock only, p = 0.9969; Cont vs TE buffer injection, p = 0.9981 |
Fig. 2D | Nonparametric | Steel–Dwass | Cont vs Puncture only, p = 0.9989; Cont vs pDNA injection, p = 0.0015; Cont vs Electrical shock only, p = 0.9994; Cont vs TE buffer injection, p = 0.9913 |